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Continuous Defect Prediction in CI/CD Pipelines: A Machine Learning-Based Framework.

Lazzarinetti GiorgioMassarenti NicolaSgrò FabioSalafia Andrea
Published in: AI*IA (2021)
Keyphrases
  • machine learning
  • computational intelligence
  • machine learning methods
  • main contribution
  • computer vision
  • learning algorithm
  • pattern recognition
  • information extraction
  • defect prediction