Predicting software defects: A cost-sensitive approach.
Miguel E. R. BezerraAdriano L. I. OliveiraPaulo J. L. AdeodatoPublished in: SMC (2011)
Keyphrases
- cost sensitive
- misclassification costs
- multi class
- cost sensitive learning
- binary classification
- cost sensitive classification
- class distribution
- active learning
- class imbalance
- probability estimates
- confidence weighted
- neural network
- naive bayes
- support vector machine
- multi label
- supervised learning
- nearest neighbor
- data mining
- data sets