Efficient Classification for Metric Data.
Lee-Ad GottliebAryeh KontorovichRobert KrauthgamerPublished in: IEEE Trans. Inf. Theory (2014)
Keyphrases
- data sets
- data analysis
- feature selection
- high quality
- raw data
- experimental data
- database
- pattern recognition
- data quality
- data sources
- training samples
- data processing
- synthetic data
- data mining techniques
- sensor data
- image data
- classification accuracy
- prior knowledge
- data structure
- spatial data
- distance function
- missing values
- support vector machine svm
- data reduction
- data collection
- image classification
- small number
- support vector machine
- data points
- probability distribution
- end users
- feature space
- preprocessing
- support vector