Login / Signup

Fine-Grain Voltage Tuned Cache Architecture for Yield Management Under Process Variations.

Joonho KongYan PanSerkan OzdemirAnitha MohanGokhan MemikSung Woo Chung
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2012)
Keyphrases
  • fine grain
  • coarse grain
  • yield management
  • real time
  • data structure
  • bayesian networks
  • peer to peer
  • total cost