Login / Signup
Parametric yield formulation of MOS IC's affected by mismatch effect.
Massimo Conti
Paolo Crippa
Simone Orcioni
Claudio Turchetti
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1999)
Keyphrases
</>
integrated circuit
computer vision
information systems
least squares
data sets
databases
artificial intelligence
image sequences
objective function
convex relaxation
negative impact