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SACCI: Scan-Based Characterization Through Clock Phase Sweep for Counterfeit Chip Detection.
Yu Zheng
Xinmu Wang
Swarup Bhunia
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2015)
Keyphrases
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high speed
low cost
automatic detection
detection method
detection algorithm
image processing
object detection
false positives
detection rate
false alarms
learning phase
evolutionary algorithm
signal processing
event detection
training phase