MuSc: Zero-Shot Industrial Anomaly Classification and Segmentation with Mutual Scoring of the Unlabeled Images.
Xurui LiZiming HuangFeng XueYu ZhouPublished in: CoRR (2024)
Keyphrases
- pattern recognition
- support vector machine
- classification accuracy
- image classification
- feature vectors
- feature selection
- image segmentation
- unsupervised learning
- machine learning
- support vector
- multiscale
- decision trees
- feature extraction
- feature set
- training samples
- model selection
- unlabeled samples
- supervised learning
- image data
- feature space
- object recognition
- computer vision