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A unified system level error model of crosstalk and electromigration for on-chip interconnect.
Hyeonggeon Lee
Jong Kang Park
Jong Tae Kim
Published in:
IEICE Electron. Express (2017)
Keyphrases
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probabilistic model
mathematical model
statistical model
unified model
prior knowledge
computational model
experimental data
real time
genetic algorithm
high level
image sequences
multi agent systems
high speed
parameter estimation
prediction model