PaLM: Point Cloud and Large Pre-trained Model Catch Mixed-type Wafer Defect Pattern Recognition.

Hongquan He Guowen Kuang Qi Sun Hao Geng

Published in: DATE (2024)

Keyphrases

pattern recognition
point cloud
statistical model
data sets
neural network
machine learning
computer vision
pre trained
three dimensional
training data
viewpoint
probabilistic model
small number
nearest neighbor
principal component analysis