Shelf Life Prediction by Intelligent RFID - Technical Limits of Model Accuracy.
Reiner JedermannJean-Pierre EmondWalter LangPublished in: LDIC (2007)
Keyphrases
- prediction model
- prediction accuracy
- probabilistic model
- hybrid model
- formal model
- neural network
- management system
- mobile phone
- error rate
- computational model
- theoretical analysis
- predictive model
- neural network model
- statistical model
- intelligent systems
- supply chain
- objective function
- similarity measure
- machine learning