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Process Window and Device Variations Evaluation using Array-Based Characterization Circuits.

C. TaberyM. CraigG. BurbachB. WagnerS. McGowanP. EtterS. RolingC. HaidinyakE. Ehrichs
Published in: ISQED (2006)
Keyphrases
  • process model
  • neural network
  • evaluation process
  • multiscale
  • data structure
  • video sequences
  • control system
  • infrared
  • evaluation model
  • window size