Login / Signup

Failure predictive model of capacitive RF-MEMS.

S. MelléD. De ContoL. MazenqDavid DubucB. PoussardC. BordasKatja GrenierLaurent BaryOlivier VendierJ. L. Muraro
Published in: Microelectron. Reliab. (2005)
Keyphrases