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Integrating an attention-based deep learning framework and the SAFY-V model for winter wheat yield estimation using time series SAR and optical data.

Dong HanPengxin WangKevin TanseyJunming LiuYue ZhangHuiren TianShuyu Zhang
Published in: Comput. Electron. Agric. (2022)
Keyphrases
  • deep learning
  • data sets
  • probabilistic model
  • parameter estimation
  • prior knowledge
  • em algorithm
  • computer vision
  • object recognition
  • data points
  • knowledge discovery
  • higher order