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Analysis of Switching Characteristics of Wide SOA and High Reliability 100 V N-LDMOS Transistor with Dual RESURF and Grounded Field Plate Structure.
Anna Kuwana
Jun-Ichi Matsuda
Haruo Kobayashi
Published in:
ASICON (2021)
Keyphrases
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high reliability
wide range
high precision
structural analysis
image analysis
neural network
e learning
multiscale
high speed