Login / Signup
An extension to IEEE Std. 1241 sine fit for analog-to-information converters testing.
Pasquale Daponte
Luca De Vito
Sergio Rapuano
Published in:
I2MTC (2015)
Keyphrases
</>
information sources
contextual information
information retrieval
prior knowledge
information processing
real time
neural network
keywords
domain knowledge
end users