13fJ/bit probing-resilient 250K PUF array with soft darkbit masking for 1.94% bit-error in 22nm tri-gate CMOS.
Sudhir SatpathySanu MathewJiangtao LiPatrick KoeberlMark A. AndersHimanshu KaulGregory K. ChenAmit AgarwalSteven HsuRam KrishnamurthyPublished in: ESSCIRC (2014)
Keyphrases
- cmos technology
- nm technology
- random access memory
- low voltage
- bit errors
- power consumption
- low power
- image sensor
- metal oxide semiconductor
- error correction
- analog to digital converter
- low cost
- bit error rate
- power dissipation
- video transmission
- silicon on insulator
- human visual system
- entropy coding
- error concealment
- dynamic range
- high speed
- channel coding
- computer simulation
- image processing