On the use of synthetic images in deep learning for defect recognition in industrial infrastructures.
Clement MailheAmine AmmarFrancisco ChinestaPublished in: ICMVA (2023)
Keyphrases
- deep learning
- unsupervised learning
- unsupervised feature learning
- machine learning
- object recognition
- weakly supervised
- pattern recognition
- action recognition
- deep architectures
- mental models
- feature extraction
- partial occlusion
- restricted boltzmann machine
- bayesian networks
- semi supervised
- supervised learning
- training data