Login / Signup
An Approach to Detect Negative Bias Temperature Instability (NBTI) in Ultra-Deep Submicron Technologies.
Ronald Carlsten
Jeremy Ralston-Good
Douglas Goodman
Published in:
ISCAS (2007)
Keyphrases
</>
high speed
positive and negative
detection algorithm
low cost
detection method
automatic detection
vlsi circuits
social networks
information technology
emerging technologies
multimedia
wireless sensor networks
low power
temperature control