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Supporting Complaint Management in the Medical Technology Industry by Means of Deep Learning.
Philip Hake
Jana-Rebecca Rehse
Peter Fettke
Published in:
Business Process Management Workshops (2019)
Keyphrases
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deep learning
unsupervised learning
rfid technology
unsupervised feature learning
decision support
machine learning
weakly supervised
face recognition
pattern recognition
viewpoint
mental models
decision making
multiscale
deep architectures