A classification and systematic review of product line feature model defects.
Megha BhushanArun NegiPiyush SamantShivani GoelAjay KumarPublished in: Softw. Qual. J. (2020)
Keyphrases
- product line
- mathematical model
- classification models
- classification method
- pattern recognition
- classification accuracy
- feature vectors
- relational databases
- support vector
- database
- image features
- feature set
- text classification
- training data
- high level
- software architecture
- feature selection
- software product line
- machine learning