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An Automated 3D Algorithm for Neo-cortical Thickness Measurement.

Siddharth SrivastavaFrederik MaesDirk VandermeulenPatrick DupontWim Van PaesschenPaul Suetens
Published in: MICCAI (2) (2003)
Keyphrases
  • similarity measure
  • search space
  • segmentation algorithm
  • feature selection
  • probabilistic model
  • energy function
  • quantitative analysis
  • cortical thickness
  • group wise