Radiation-hardened techniques for CMOS flash ADC.
Umberto GattiCristiano CalligaroEvgeny PikhayYakov RoizinPublished in: ICECS (2014)
Keyphrases
- analog to digital converter
- x ray
- infrared
- single chip
- low cost
- power consumption
- power supply
- high speed
- circuit design
- focal plane
- cmos image sensor
- image sensor
- analog vlsi
- hd video
- low voltage
- low power
- delay insensitive
- radiation dose
- three dimensional
- sigma delta
- disk drives
- cmos technology
- genetic algorithm
- mathematical model