A Novel Test Point Selection Method for Analog Fault Dictionary Techniques.
Chenglin YangShulin TianBing LongFang ChenPublished in: J. Electron. Test. (2010)
Keyphrases
- experimental evaluation
- computational cost
- high precision
- significant improvement
- high accuracy
- detection method
- similarity measure
- selection algorithm
- selection scheme
- decision trees
- classification method
- segmentation method
- support vector machine svm
- computationally efficient
- signal processing
- mutual information
- feature set
- probabilistic model
- computational complexity