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Output analysis research: why bother? (panel discussion).

John M. CharnesJohn S. Carson IIMerriel C. DewsnupAndrew F. SeilaJeffrey D. TewRandall P. Sadowski
Published in: WSC (1994)
Keyphrases
  • panel discussion
  • image analysis
  • statistical analysis
  • wide range
  • artificial intelligence
  • training data
  • multiscale