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An Investigation of Electric Field and Breakdown Voltage Models for a Deep Trench Superjunction SiC VDMOS.

Tao LiuShengdong HuJian-an WangGang GuoJun LuoYuan WangJingwei GuoYanmeng Huo
Published in: IEEE Access (2019)
Keyphrases
  • electric field
  • model selection
  • accurate models
  • image segmentation
  • probabilistic model
  • power system
  • statistical models
  • database
  • real time
  • prior knowledge
  • classification models
  • mathematical models
  • autoregressive