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An intelligent analysis of Iddq data for chip classification in very deep-submicron (VDSM) CMOS technology.

Chia-Ling ChangChia-Ching ChangHui-Ling ChanCharles H.-P. WenJayanta Bhadra
Published in: ASP-DAC (2012)
Keyphrases
  • correlation analysis
  • high speed
  • feature selection
  • high quality
  • classification accuracy
  • computer systems
  • multimedia
  • image sequences
  • data processing
  • space time
  • power consumption
  • cmos technology