A physics-based electromigration reliability model for interconnects lifetime prediction.
Linlin CaiWangyong ChenJinfeng KangGang DuXiaoyan LiuXing ZhangPublished in: Sci. China Inf. Sci. (2021)
Keyphrases
- mathematical model
- statistical model
- prediction model
- theoretical framework
- probabilistic model
- decision making
- formal model
- computational model
- prediction accuracy
- parameter estimation
- cost function
- hybrid model
- multiscale
- classification models
- prediction error
- linear regression model
- bayesian framework
- deformable models
- petri net
- low cost
- management system
- recommender systems
- reinforcement learning
- bayesian networks