Login / Signup
MuSc: Zero-Shot Industrial Anomaly Classification and Segmentation with Mutual Scoring of the Unlabeled Images.
Xurui Li
Ziming Huang
Feng Xue
Yu Zhou
Published in:
ICLR (2024)
Keyphrases
</>
image segmentation
pattern recognition
machine learning
training set
support vector
feature vectors
classification accuracy
support vector machine
image classification
feature selection
unsupervised learning
model selection
supervised learning
decision trees
low level
class labels
image regions
unlabeled images