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Multiple SVM classification syatem based on Choquet integral with respect to composed measure of L-measure and Delta-measure.

Wen-Chih LinChih-Sheng HuangJeng-Ming YihDer-Bang WuYen-Kuei Yu
Published in: ICMLC (2010)
Keyphrases
  • similarity measure
  • neural network
  • face recognition
  • pattern recognition