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An efficient error-masking technique for improving the soft-error robustness of static CMOS circuits.

Srivathsan KrishnamohanNihar R. Mahapatra
Published in: SoCC (2004)
Keyphrases
  • error rate
  • high speed
  • error bounds
  • circuit design
  • delay insensitive
  • low cost
  • computational efficiency
  • relative error
  • low voltage
  • analog vlsi