Comparison of Electrical and Reliability Characteristics of Different Tunnel Oxides in SONOS Flash Memory.
Jia-Lin WuHua-Ching ChienChien-Wei LiaoCheng-Yen WuChih-Yuan LeeHoung-Chi WeiShih-Hsien ChenHann-Ping HwangSaysamone PittikounTravis ChoChin-Hsing KaoPublished in: MTDT (2006)