Low-frequency noise of thick-film resistors as quality and reliability indicator.
Dubravka RocakDarko BelavicMarko HrovatJosef SikulaPavel KoktavyJan PavelkaVlasta SedlakovaPublished in: Microelectron. Reliab. (2001)
Keyphrases
- low frequency
- high frequency
- frequency domain
- wavelet transform
- wavelet analysis
- subband
- frequency band
- high quality
- discrete wavelet transform
- original images
- electromagnetic fields
- high resolution
- quality measures
- low pass
- low and high frequency
- high frequency components
- dct domain
- visual quality
- fusion rules
- quality assessment
- multiscale
- feature selection