A monitoring circuit for NBTI degradation at 65nm technology node.

Yandong He Jie Hong Ganggang Zhang Lin Han Xing Zhang

Published in: ISCAS (2013)

Keyphrases

nm technology
power consumption
power dissipation
low power
real time
monitoring system
high speed
low cost
circuit design
directed graph
cmos technology
social networks
image segmentation
electronic circuits
analog circuits
graph structure
markov random field
high resolution
pattern recognition