Login / Signup

Exploring the border traps near the SiO2-SiC interface using conductance measurements.

P. KumarM. KrummenacherH. G. MedeirosS. RaceP. NatzkeI. Kovacevic-BadstübnerM. E. BathenU. Grossner
Published in: IRPS (2024)
Keyphrases
  • user interface
  • computer interface
  • user friendly
  • visual interface
  • real time
  • graphical interface
  • real world
  • case study
  • database systems
  • natural language interface
  • measurement noise
  • direct manipulation