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Further Results on Order Statistics Generated by Two Simulation Methods.

William VoltermanErhard CramerKatherine F. DaviesNarayanaswamy Balakrishnan
Published in: Commun. Stat. Simul. Comput. (2014)
Keyphrases
  • order statistics
  • pattern recognition
  • high quality
  • probabilistic model
  • generative model
  • binary images