The Coupling Model for Function and Delay Faults.
Joonhwan YiJohn P. HayesPublished in: J. Electron. Test. (2005)
Keyphrases
- management system
- prior knowledge
- probabilistic model
- high level
- objective function
- statistical model
- information retrieval
- formal model
- neural network
- parameter estimation
- theoretical framework
- least squares
- prediction model
- experimental data
- mathematical model
- em algorithm
- markov random field
- expert systems
- machine learning