Login / Signup
A New Measurement Circuit to Evaluate Current Collapse Effect of GaN HEMTs Under Practical Conditions.
Guoen Cao
Arsalan Ansari
Hee-Jun Kim
Published in:
IEEE Trans. Instrum. Meas. (2015)
Keyphrases
</>
decision making
decision trees
sufficient conditions
real world
metadata
database systems
multi agent
color images
high speed
integrated circuit
future development
future trends
low voltage