Test challenges for deep sub-micron technologies.

Kwang-Ting Cheng Sujit Dey Mike Rodgers Kaushik Roy

Published in: DAC (2000)

Keyphrases

lessons learned
design principles
academic community
innovative approaches
future trends
ubiquitous and pervasive
enterprise search
data sets
data mining
information systems
user interface
low cost
learning systems
technical challenges
innovative ways