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Defect inspection for TFT-LCD images based on the low-rank matrix reconstruction.

Yi-Gang CenRui-Zhen ZhaoLi-Hui CenLihong CuiZhenjiang MiaoZhe Wei
Published in: Neurocomputing (2015)
Keyphrases
  • low rank matrix
  • image data
  • input image
  • low rank
  • image reconstruction
  • tft lcd
  • face recognition
  • high quality
  • small number
  • feature points
  • image restoration
  • singular value decomposition
  • pixel values