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Corrigendum to "A process and temperature robust constant-gminput/output rail-to-rail op-amp" [Microelectron. J. 46(2015) 506-512].

Nima ShahpariRasoul DehghaniPayam Rabbani
Published in: Microelectron. J. (2017)
Keyphrases
  • high speed
  • process model
  • database
  • neural network
  • image segmentation
  • least squares
  • development process
  • feedback loop