Identification of a threshold value for the DEMATEL method using the maximum mean de-entropy algorithm to find critical services provided by a semiconductor intellectual property mall.
Chung-Wei LiGwo-Hshiung TzengPublished in: Expert Syst. Appl. (2009)
Keyphrases
- dynamic programming
- high accuracy
- computational cost
- optimization algorithm
- segmentation algorithm
- experimental evaluation
- cost function
- threshold selection
- detection algorithm
- preprocessing
- detection method
- significant improvement
- improved algorithm
- computational complexity
- information entropy
- k means
- synthetic and real images
- estimation algorithm
- matching algorithm
- energy function
- convergence rate
- optimization method
- intellectual property
- similarity measure
- theoretical analysis
- objective function
- computationally efficient
- absolute error
- clustering method
- input data
- recognition algorithm
- learning algorithm
- identification rate
- support vector machine svm
- classification algorithm
- minimum error
- expectation maximization
- adaptive threshold
- mutual information
- segmentation method
- relative entropy
- optimal solution
- tree structure
- gray value
- probabilistic model
- end users
- roc curve
- knowledge management
- simulated annealing
- information theoretic