Comments on "Cryogenic noise parameter measurements of microwave devices".
Wojciech WiatrPublished in: IEEE Trans. Instrum. Meas. (2004)
Keyphrases
- measurement noise
- measurement errors
- missing data
- random noise
- residual error
- mobile devices
- measurement error
- signal to noise ratio
- noise model
- low cost
- embedded devices
- image noise
- noise level
- multiscale
- additive noise
- low frequency
- parameter values
- noise reduction
- noise removal
- input parameters
- personal computer
- arbitrary shape
- mobile applications
- noise free
- embedded systems
- imaging devices
- context aware
- input image
- real time