3D Modelling of Fluctuation Effects in Highly Scaled VLSI Devices.

Thomas D. Linton Jr.Shaofeng Yu Reaz Shaheed

Published in: VLSI Design (2001)

Keyphrases

vlsi design
databases
mobile devices
embedded devices
signal processing
real time
multiscale
modelling language
negative effects
embedded systems
high speed
pattern recognition
case study
multimedia
decision making
genetic algorithm
machine learning
neural network
data sets