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Off-state degradation with ac bias in PMOSFET.

Segeun ParkHyuckchai JungJeonghoon OhIlgweon KimHyoungsun HongGyoyoung JinYonghan Roh
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • data sets
  • state space
  • data mining
  • high level
  • high quality
  • data structure
  • feature space
  • special case