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Importance Boundary Sampling for SRAM Yield Analysis With Multiple Failure Regions.

Jian YaoZuochang YeYan Wang
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2014)
Keyphrases
  • neural network
  • data analysis
  • statistical analysis
  • graph cuts
  • power consumption
  • object boundaries