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An explanatory analysis on eclipse beta-release bugs through in-process metrics.

Ayse Tosun MisirliBrendan MurphyThomas ZimmermannAyse Basar Bener
Published in: WoSQ@ESEC/FSE (2011)
Keyphrases
  • data analysis
  • artificial intelligence
  • expert systems
  • neural network
  • e learning
  • knowledge base
  • multiscale
  • image analysis
  • software systems
  • development process
  • similarity metrics