A best-matching protocol for collaborative e-work and e-manufacturing.

Juan Diego Velásquez Shimon Y. Nof

Published in: Int. J. Comput. Integr. Manuf. (2008)

Keyphrases

matching algorithm
lightweight
feature points
manufacturing systems
matching scheme
collaborative learning
pattern matching
image matching
graph matching
keypoints
multi user
communication protocol
matching process
formal analysis
security analysis
application layer
semiconductor manufacturing