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Charge trapping challenges of CMOS embedded complementary FeFETs.
Sven Beyer
Dominik Kleimaier
Stefan Dünkel
Halid Mulaosmanovic
Steven Soss
Johannes Müller
Zhouhang Jiang
Kai Ni
Thomas Mikolajick
Haidi Zhou
Published in:
IMW (2024)
Keyphrases
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lessons learned
high speed
key issues
databases
power consumption
open issues
charge coupled devices
low cost
embedded systems
learning rate
technical challenges
neural network
real world
image processing
digital camera
power supply