Analytical Study of the Fading Memory Phenomenon in a TaOx Memristor Model.
Ioannis MessarisAlon AscoliAhmet Samil DemirkolVasileios G. NtinasRonald TetzlaffPublished in: ICECS 2022 (2022)
Keyphrases
- study proposes
- conceptual model
- theoretical framework
- neural network
- computational model
- statistical model
- probabilistic model
- high level
- mathematical model
- similarity measure
- simulation study
- theoretical foundation
- optimization problems
- optimization algorithm
- simulated annealing
- objective function
- parameter values