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Parallel Test Pattern Generation Using Circuit Partitioning in a Shared-Memory Multiprocessor.
Consolación Gil
Julio Ortega
José Luis Bernier
Maria Dolores Gil Montoya
Published in:
PARA (1998)
Keyphrases
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shared memory multiprocessor
shared memory
high speed
parallel processing
efficient implementation
parallel computing
parallel algorithm
distributed memory
data partitioning
message passing
similarity measure
bayesian networks
pairwise
stereo matching
graph partitioning
electronic circuits